LAC Performance Testing
Box Level
- All Cards Simulated on an Individual Basis
- TECs Tested with Engineering Backplane (Focal Plane)
- Focal Plane Timing Tested with Multiplexers
Subsystem Level
- OM: Limited Set of Images Obtained with EM Simulator
- Engineering Model Vibration Tested
- EM: Operation Tested by Interface to OM Simulator
Instrument Level
- Vibration and Thermal-Vacuum
- Radiometric/ Spectral Calibration and Alignment
- EMI/EMC